Public Domain Picture: Scanning Electron Microscope with Spin Polarization Analysis

This NIST-developed instrument, a scanning electron microscope with spin polarization analysis, is the highest resolution magnetization imaging instrument in the United States. It can image magnetic nanostructures--areas where a magnetic field flows in one direction--as small as 10 nanometers and can detect the magnetization of as few as a thousand iron atoms. It is used for studying advanced computer memory, magnetic sensors and other materials and magneto-electronic devices. Located in one of the two AML metrology wings, the instrument in encased in a plexiglass enclosure for shielding against acoustic vibration and temperature changes from other laboratory equipment in the larger room. This image may be used for any NIST purpose. Correct photo credit must be provided. Other organizations may use this image without charge for editorial articles that mention NIST in accompanying text or a caption. Correct photo credit must be provided. 'Stock art' use requires permission and may require payment to the photographer. To receive a high resolution version send an email with the image AV number (04DO014) and title to inquiries@nist.gov. Credit: Courtesy HDR Architecture, Inc./Steve Hall © Hedrich Blessing Disclaimer: Any mention of commercial products within NIST web pages is for information only; it does not imply recommendation or endorsement by NIST. Use of NIST Information: These World Wide Web pages are provided as a public service by the National Institute of Standards and Technology (NIST). With the exception of material marked as copyrighted, information presented on these pages is considered public information and may be distributed or copied. Use of appropriate byline/photo/image credits is requested.

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Electronics, Nanotechnology, Nationalinstituteofstandardsandtechnology, Nist

April 2, 2014